Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...

The exponential growth in design sizes has rendered the traditional methods of design-for-test, layout, and timing closure no longer sufficient. Design and test engineers not only have to constantly ...

Development of a new automated test method to measure the wax appearance temperature (WAT) of opaque crude oils with 1.0° C. precision used a modified version of American Society of Testing and ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

President, Wyoming Test Fixtures Inc. One of the recurring themes in this column over the past few years has been the development of new test methods for sandwich composites. This is primarily a ...