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XSense™ is a novel parallel beam wavelength dispersive X-ray spectrometer (WDS) for elemental analysis on scanning electron microscopes (SEM). Specifically designed for the lower energy range between ...
At the Microscopy & Microanalysis 2013 Meeting, Bruker has introduced two new instruments which further expand its portfolio of high-performance tools for materials characterization in electron ...
energy range Elements with high energy X-ray lines. Therefore, the addition of a micro X-ray (micro-XRF) source and a wavelength dispersive spectrometer (WDS) will enhance the analytical capability of ...