IEEE

Low Overhead FPGA-based RISC-V Resilient To Upsets In User Bits

Abstract: In the context of Field Programmable Gate Array (FPGA)-based space applications and very harsh environments, this paper studies the protection of user bits from Single Event Upsets (SEUs) as ...
GitHub

arrays_and_collections.html

<li class="toctree-l1"><a class="reference internal" href="numpy_and_pandas_transforms.html">NumPy and Pandas Transforms</a></li> <li class="toctree-l1"><a class ...
IEEE

Testing Method for Embedded UltraRAM in Field Programmable Gate Arrays

Most testing methods for Field Programmable Gate Array (FPGA) on-chip memory are designed for Block RAM, which cannot detect all possible faults in UltraRAM due to its different structures and ...