Abstract: We present a one-class anomaly detection method that uses time series sensor data to detect anomalies or faults in semiconductor fabrication processes. Critically, this method is trained ...
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Abstract: Information theory-based feature selection (ITFS) methods select a single subset of features for all classes based on the following criteria: 1) minimizing redundancy between the selected ...
This journal article was first published in the Pittsburgh Tax Review, where the full text can be found. Economists have found that discrimination and economic exclusion have contributed to ...
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